X-Ray Induced Secondary Particle Counting With Thin NbTiN Nanowire Superconducting Detector

نویسندگان

چکیده

We characterized the performance of abiased superconducting nanowire to detect X-ray photons. The device, made a 10 nm thin NbTiN film and fabricated on dielectric substrate ( $SiO_{2}$ , Nb notation="LaTeX">$_{3}$ O notation="LaTeX">$_{5}$ ) detected 1000 times larger signal than anticipated from direct absorption. attributed this effect induced generation secondary particles in substrate. enhancement corresponds an increase flux by factor 3.6, relative state-of-the-art commercial silicon drift detector. detector exhibited 8.25 ns temporal recovery time 82 ps timing resolution, measured using optical Our results emphasize importance single photon detectors.

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ژورنال

عنوان ژورنال: IEEE Transactions on Applied Superconductivity

سال: 2021

ISSN: ['1558-2515', '1051-8223']

DOI: https://doi.org/10.1109/tasc.2021.3066578